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產品類型 / Product Type:




產品應用 / Application:


The Kelvin Probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (wf) of conducting materials or surface potential (sp) of semiconductor or insulating surfaces. The wf of a surface is typically de.ned by the topmost 1-3 layers of atoms or molecules, so the Kelvin Probe is one of the most sensitive surface analysis techniques available. KP Technology Systems very high wf resolution of 1-3 meV, currently the highest achieved by any commercial device.


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規格說明 / Specification:



▲2mm and 50 micron tips standard

▲Work Function resolution of 1-3meV (2mm tip), 5-10meV (50 micron with optical table support)

▲Manual Height Control (25.4mm KP translation)

▲Tracking System with automatic control of tip to sample spacing

▲Off-null detection system with parasitic capacity rejection



▲Digital Control of all Kelvin Probe parameters

▲Simple set-up procedure for signal optimization

▲Fast measurement mode for tracking real time work function changes (1000 work function points / min at ~20meV resolution)

▲Export of data to scienti.c analysis software



▲Kelvin Probe Head Unit with Integrated Tip Amplifier

▲2mm and 50 micron tipu 300x300x12.7mm optical breadboard base

▲Faraday Screen

▲Sample Holder

▲Gold Aluminium Reference Sample

▲Digital Control Unit

▲Dell PC with monitor

▲Pre-installed KP software and Data Acquisition system

▲Spare Tip Amplifier

▲Autosensing Power Supply Unit

▲12 Month Warranty


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