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Nordson Sonoscan
AW SERIES C‑SAM
Nordson Test & Inspection’s C-SAM acoustic microscopes are recognized as the benchmark for accuracy. You’ll benefit from the unmatched expertise of our dedicated acoustic applications engineers. Our engineers represent the leading minds in AMI and regularly receive industry recognition and awards, including the prestigious IEEE Rayleigh Award.
https://www.nordson.com/en/divisions/sonoscan/products/acoustic-inspection-systems
Brand
Operator-Free Wafer Inspection, Analysis and Sorting. The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
Application
Specification
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